| Abstract: | The regolith at Tranquillity Base is a layer of fragmental debris that ranges in thickness from about 3 to 6 meters. The thickness of the regolith and the exposure histories of its constituent fragments can be related, by means of a relatively simple model, to the observed crater distribution. |
| Genre: | Article |
| ProdID: | 70010148 |
| Citation Author: | Shoemaker, E. M.; Hait, M. H.; Swann, G. A.; Schleicher, D. L.; Dahlem, D. H.; Schaber, G. G.; Sutton, R. L. |
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| Citation End Page: | 455 |
| Citation Issue: | 3918 |
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| Citation Language: | English |
| Citation Larger Work Title: | Science |
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| Citation Number Of Pages: | 4 |
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| Citation Search Results Text: | Lunar regolith at Tranquillity Base; 1970; Article; Journal; Science; Shoemaker, E. M.; Hait, M. H.; Swann, G. A.; Schleicher, D. L.; Dahlem, D. H.; Schaber, G. G.; Sutton, R. L. |
| Citation Start Page: | 452 |
| Citation Volume: | 167 |
| Citation Year: | 1970 |
| Type: | citation/reference |
| Text: | Lunar regolith at Tranquillity Base; 1970; Article; Journal; Science; Shoemaker, E. M.; Hait, M. H.; Swann, G. A.; Schleicher, D. L.; Dahlem, D. H.; Schaber, G. G.; Sutton, R. L. |
| URL (THUMBNAIL): | http://pubs.er.usgs.gov/thumbnails/outside_thumb.jpg |
| Date Other: | Thu, 1 Jan 1970 00:00 -0600 |
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