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The detection of sulphur in contamination spots in electron probe X-ray microanalysis

British Journal of Applied Physics

By:
, ,
DOI: 10.1088/0508-3443/13/5/314

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Abstract

Sulphur has been identified as one of the elements present in the contamination spot which forms under the electron beam in the microprobe. The presence of the sulphur results in a rapid change in intensity measurements causing a loss of observed intensity for elements other than sulphur. The source of sulphur has been traced at least in part to the Apiezon B diffusion pump oil. A comparative X-ray fluorescence study of the Apiezon B and Octoil diffusion pump oils showed substantial amounts of sulphur in the Apiezon B. The Octoil was relatively free of sulphur.

Additional Publication Details

Publication type:
Article
Publication Subtype:
Journal Article
Title:
The detection of sulphur in contamination spots in electron probe X-ray microanalysis
Series title:
British Journal of Applied Physics
DOI:
10.1088/0508-3443/13/5/314
Volume
13
Issue:
5
Year Published:
1962
Language:
English
Larger Work Type:
Article
Larger Work Subtype:
Journal Article
Larger Work Title:
British Journal of Applied Physics
First page:
245
Last page:
246
Number of Pages:
2