| Abstract: | The value of peak width at half-height for the illite 001 XRD reflection is known as the Kubler index or the illite "crystallinity‘ index. This measurement, which has been related to the degree of metamorphism of very low-grade, pelitic rocks, is a function of at least two crystal-chemical factors: 1) illite X-ray scattering domain size; and 2) illite structural distortions (especially swelling). Reynolds‘ NEWMOD computer program is used to construct a grid with which these two contributions to illite peak width can be determined independently from measurements of the 001 peak width at half-height and the Srodon intensity ratio. This method yields more information about changes undergone by illite during metamorphism than application of the Kubler index method alone. -Authors |
| Genre: | Article |
| ProdID: | 70015176 |
| Citation Author: | Eberl, D. D.; Velde, B. |
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| Citation End Page: | 577 |
| Citation Issue: | 4 |
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| Citation Language: | English |
| Citation Larger Work Title: | Clay Minerals |
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| Citation Number Of Pages: | 7 |
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| Citation Search Results Text: | Beyond the Kubler index; 1989; Article; Journal; Clay Minerals; Eberl, D. D.; Velde, B. |
| Citation Start Page: | 571 |
| Citation Volume: | 24 |
| Citation Year: | 1989 |
| Type: | citation/reference |
| Text: | Beyond the Kubler index; 1989; Article; Journal; Clay Minerals; Eberl, D. D.; Velde, B. |
| URL (THUMBNAIL): | http://pubs.er.usgs.gov/thumbnails/outside_thumb.jpg |
| URL (DOCUMENT): | http://www.minersoc.org/pages/Archive-CM/Volume_24/24-4-571.pdf |
| Date Other: | Sun, 1 Jan 1989 00:00 -0600 |
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