| Abstract: | Synchrotron radiation sources offer important features for the analysis of a material. Among these features is the ability to determine both the elemental composition of the material and the chemical state of its elements. For microscopic analysis synchrotron X-ray fluorescence (SXRF) microprobes now offer spatial resolutions of 10 ??m with minimum detection limits in the 1-10 ppm range depending on the nature of the sample and the synchrotron source used. This paper describes the properties of synchrotron radiation and their importance for elemental analysis, existing synchrotron facilities and those under construction that are optimum for SXRF microanalysis, and a number of applications including the high energy excitation of the K lines of heavy elements, microtomography, and XANES and EXAFS spectroscopies. ?? 1990. |
| Genre: | Article |
| ProdID: | 70016223 |
| Citation Author: | Chen, J. R.; Chao, E. C. T.; Minkin, J. A.; Back, J. M.; Jones, K. W.; Rivers, M. L.; Sutton, S. R. |
| Citation Contributing Office: | |
| Citation Datum: | |
| Citation Day: | |
| Citation Edition: | |
| Citation Editor: | |
| Citation End Page: | 543 |
| Citation Issue: | 1-4 |
| Citation Keywords: | |
| Citation Language: | English |
| Citation Larger Work Title: | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms |
| Citation LatN: | |
| Citation LatS: | |
| Citation LonE: | |
| Citation LonW: | |
| Citation Month: | |
| Citation No Pagination: | |
| Citation Number Of Pages: | 11 |
| Citation Online Only Flag: | |
| Citation Phsyical Description: | |
| Citation Projection: | |
| Citation Public Comments: | |
| Citation Publisher: | Elsevier |
| Citation Series: | |
| Citation Series Code: | |
| Citation Series Number: | |
| Citation Search Results Text: | The uses of synchrotron radiation sources for elemental and chemical microanalysis; 1990; Article; Journal; Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms; Chen, J. R.; Chao, E. C. T.; Minkin, J. A.; Back, J. M.; Jones, K. W.; Rivers, M. L.; Sutton, S. R. |
| Citation Start Page: | 533 |
| Citation Volume: | 49 |
| Citation Year: | 1990 |
| Type: | citation/reference |
| Text: | The uses of synchrotron radiation sources for elemental and chemical microanalysis; 1990; Article; Journal; Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms; Chen, J. R.; Chao, E. C. T.; Minkin, J. A.; Back, J. M.; Jones, K. W.; Rivers, M. L.; Sutton, S. R. |
| URL (THUMBNAIL): | http://pubs.er.usgs.gov/thumbnails/outside_thumb.jpg |
| URL (DIGITAL OBJECT IDENTIFIER): | http://dx.doi.org/10.1016/0168-583X(90)90305-E |
| Date Other: | Mon, 1 Jan 1990 00:00 -0600 |
| Publisher: | Elsevier |
