| Abstract: | The Landsat-7 Image Assessment System (IAS), part of the Landsat-7 Ground System, will calibrate and evaluate the radiometric and geometric performance of the Enhanced Thematic Mapper Plus (ETM +) instrument. The IAS incorporates new instrument radiometric artifact correction and absolute radiometric calibration techniques which overcome some limitations to calibration accuracy inherent in historical calibration methods. Knowledge of ETM + instrument characteristics gleaned from analysis of archival Thematic Mapper in-flight data and from ETM + prelaunch tests allow the determination and quantification of the sources of instrument artifacts. This a priori knowledge will be utilized in IAS algorithms designed to minimize the effects of the noise sources before calibration, in both ETM + image and calibration data. |
| Genre: | Conference Paper |
| ProdID: | 70018770 |
| Citation Author: | Boncyk, Wayne, C.; Markham, Brian, L.; Barker, John, L.; Helder, Dennis |
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| Citation End Page: | 1272 |
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| Citation Language: | English |
| Citation Larger Work Title: | International Geoscience and Remote Sensing Symposium (IGARSS) |
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| Citation Number Of Pages: | 3 |
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| Citation Publisher: | IEEE |
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| Citation Search Results Text: | Artifact correction and absolute radiometric calibration techniques employed in the Landsat 7 image assessment system; 1996; Conference Paper; International Geoscience and Remote Sensing Symposium (IGARSS); Boncyk, Wayne, C.; Markham, Brian, L.; Barker, John, L.; Helder, Dennis |
| Citation Start Page: | 1270 |
| Citation Volume: | 2 |
| Citation Year: | 1996 |
| Type: | citation/reference |
| Text: | Artifact correction and absolute radiometric calibration techniques employed in the Landsat 7 image assessment system; 1996; Conference Paper; International Geoscience and Remote Sensing Symposium (IGARSS); Boncyk, Wayne, C.; Markham, Brian, L.; Barker, John, L.; Helder, Dennis |
| URL (THUMBNAIL): | http://pubs.er.usgs.gov/thumbnails/outside_thumb.jpg |
| Date Other: | Mon, 1 Jan 1996 00:00 -0600 |
| Publisher: | IEEE |
