| Abstract: | In this study, the data reduction steps that can be used to extract the lunar irradiance from low resolution images of the Moon are examined and the attendant uncertainties are quantitatively assessed. The response integrated over an image is compared to a lunar irradiance model being developed from terrestrial multi-band photometric observations over the 350-2500 nm range. |
| Genre: | Conference Paper |
| ProdID: | 70020918 |
| Citation Author: | Kieffer, Hugh, H.; Anderson, James, M.; Becker, Kris, J. |
| Citation Contributing Office: | |
| Citation Datum: | |
| Citation Day: | |
| Citation Edition: | |
| Citation Editor: | |
| Citation End Page: | 205 |
| Citation Issue: | |
| Citation Keywords: | |
| Citation Language: | English |
| Citation Larger Work Title: | Proceedings of SPIE - The International Society for Optical Engineering |
| Citation LatN: | |
| Citation LatS: | |
| Citation LonE: | |
| Citation LonW: | |
| Citation Month: | |
| Citation No Pagination: | |
| Citation Number Of Pages: | 13 |
| Citation Online Only Flag: | |
| Citation Phsyical Description: | |
| Citation Projection: | |
| Citation Public Comments: | |
| Citation Publisher: | Society of Photo-Optical Instrumentation Engineers |
| Citation Series: | |
| Citation Series Code: | |
| Citation Series Number: | |
| Citation Search Results Text: | Radiometric calibration of spacecraft using small lunar images; 1999; Conference Paper; Proceedings of SPIE - The International Society for Optical Engineering; Kieffer, Hugh, H.; Anderson, James, M.; Becker, Kris, J. |
| Citation Start Page: | 193 |
| Citation Volume: | 3870 |
| Citation Year: | 1999 |
| Type: | citation/reference |
| Text: | Radiometric calibration of spacecraft using small lunar images; 1999; Conference Paper; Proceedings of SPIE - The International Society for Optical Engineering; Kieffer, Hugh, H.; Anderson, James, M.; Becker, Kris, J. |
| URL (THUMBNAIL): | http://pubs.er.usgs.gov/thumbnails/outside_thumb.jpg |
| Date Other: | Fri, 1 Jan 1999 00:00 -0600 |
| Publisher: | Society of Photo-Optical Instrumentation Engineers |
