| Abstract: | Digital terrain modeling has a micro-and nanoscale counterpart in surface metrology, the numerical characterization of industrial surfaces. Instrumentation in semiconductor manufacturing and other high-technology fields can now contour surface irregularities down to the atomic scale. Surface metrology has been revolutionized by its ability to manipulate square-grid height matrices that are analogous to the digital elevation models (DEMs) used in physical geography. Because the shaping of industrial surfaces is a spatial process, the same concepts of analytical cartography that represent ground-surface form in geography evolved independently in metrology: The surface topography of manufactured components, exemplified here by automobile-engine cylinders, is routinely modeled by variogram analysis, relief shading, and most other techniques of parameterization and visualization familiar to geography. This article introduces industrial surface-metrology, examines the field in the context of terrain modeling and geomorphology and notes their similarities and differences, and raises theoretical issues to be addressed in progressing toward a unified practice of surface morphometry. |
| Genre: | Article |
| ProdID: | 70023582 |
| Citation Author: | Pike, R. J. |
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| Citation End Page: | 274 |
| Citation Issue: | 2 |
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| Citation Language: | English |
| Citation Larger Work Title: | Professional Geographer |
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| Citation Number Of Pages: | 12 |
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| Citation Search Results Text: | Digital terrain modeling and industrial surface metrology: Converging realms; 2001; Article; Journal; Professional Geographer; Pike, R. J. |
| Citation Start Page: | 263 |
| Citation Volume: | 53 |
| Citation Year: | 2001 |
| Type: | citation/reference |
| Text: | Digital terrain modeling and industrial surface metrology: Converging realms; 2001; Article; Journal; Professional Geographer; Pike, R. J. |
| URL (THUMBNAIL): | http://pubs.er.usgs.gov/thumbnails/outside_thumb.jpg |
| Date Other: | Mon, 1 Jan 2001 00:00 -0600 |
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