Surface electrical properties experiment

Simmons, Gene; Strangway, David; Annan, Peter; Baker, Richard; Bannister, Lawrence; Brown, Raymon; Cooper, William; Cubley, Dean; deBettencourt, Joseph; England, Anthony W.; Groener, John; Kong, Jin-Au; LaTorraca, Gerald; Meyer, James; Nanda, Ved; Redman, David; Rossiter, James; Tsang, Leung; Urner, Joseph; Watts, Raymond

Abstract:

The surface electrical properties (SEP) experiment was used to explore the subsurface material of the Apollo 17 landing site by means of electromagnetic radiation. The experiment was designed to detect electrical layering, discrete scattering bodies, and the possible presence of water. From the analysis of the data, it was expected that values of the electrical properties (dielectric constant and loss tangent) of lunar material in situ would be obtained.

Genre:

Book chapter

ProdID:

70042541

Citation Author:

Simmons, Gene ; Strangway, David ; Annan, Peter ; Baker, Richard ; Bannister, Lawrence ; Brown, Raymon ; Cooper, William ; Cubley, Dean ; deBettencourt, Joseph ; England, Anthony W.; Groener, John ; Kong, Jin-Au ; LaTorraca, Gerald ; Meyer, James ; Nanda, Ved ; Redman, David ; Rossiter, James ; Tsang, Leung ; Urner, Joseph ; Watts, Raymond

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Astrogeology Science Center

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15-14

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Citation Larger Work Title:

Apollo 17 preliminary science report (NASA SP-330)

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Citation Phsyical Description:

14 p.

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Citation Series:

NASA SP

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Citation Series Number:

330

Citation Search Results Text:

Surface electrical properties experiment; 1973; Book chapter; 330; Federal Government Series; Apollo 17 preliminary science report (NASA SP-330); Simmons, Gene ; Strangway, David ; Annan, Peter ; Baker, Richard ; Bannister, Lawrence ; Brown, Raymon ; Cooper, William ; Cubley, Dean ; deBettencourt, Joseph ; England, Anthony W.; Groener, John ; Kong, Jin-Au ; LaTorraca, Gerald ; Meyer, James ; Nanda, Ved ; Redman, David ; Rossiter, James ; Tsang, Leung ; Urner, Joseph ; Watts, Raymond