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The Stanford-U.S. Geological Survey SHRIMP ion microprobe--a tool for micro-scale chemical and isotopic analysis

Fact Sheet 2012-3067

In cooperation with the Stanford University School of Earth Sciences
By:
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Abstract

Answers to many questions in Earth science require chemical analysis of minute volumes of minerals, volcanic glass, or biological materials. Secondary Ion Mass Spectrometry (SIMS) is an extremely sensitive analytical method in which a 5–30 micrometer diameter "primary" beam of charged particles (ions) is focused on a region of a solid specimen to sputter secondary ions from 1–5 nanograms of the sample under high vacuum. The elemental abundances and isotopic ratios of these secondary ions are determined with a mass spectrometer. These results can be used for geochronology to determine the age of a region within a crystal thousands to billions of years old or to precisely measure trace abundances of chemical elements at concentrations as low as parts per billion. A partnership of the U.S. Geological Survey and the Stanford University School of Earth Sciences operates a large SIMS instrument, the Sensitive High-Resolution Ion Microprobe with Reverse Geometry (SHRIMP–RG) on the Stanford campus.

Additional Publication Details

Publication type:
Report
Publication Subtype:
USGS Numbered Series
Title:
The Stanford-U.S. Geological Survey SHRIMP ion microprobe--a tool for micro-scale chemical and isotopic analysis
Series title:
Fact Sheet
Series number:
2012-3067
Year Published:
2012
Language:
English
Publisher:
U.S. Geological Survey
Publisher location:
Reston, VA
Contributing office(s):
Stanford--USGS Micro Analysis Center SHRIMP Lab
Description:
4 p.
Online Only (Y/N):
N
Additional Online Files(Y/N):
N