| Abstract: | |
| Genre: | USGS Numbered Series |
| ProdID: | 8659 |
| Citation Author: | Duval, Joseph S.; Schulz, Karen A.; Pitkin, James A. |
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| Citation Language: | ENGLISH |
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| Citation Phsyical Description: | 15 leaves :ill., maps ;27 cm. |
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| Citation Publisher: | U.S. Geological Survey, |
| Citation Series: | Open-File Report |
| Citation Series Code: | OFR |
| Citation Series Number: | 77-159 |
| Citation Search Results Text: | Calibration constants for the Geodata International, Inc., and Texas Instruments, Inc.: high sensitivity systems used for the ERDA aerial gamma-ray surveys; 1977; OFR; 77-159; Duval, Joseph S.; Schulz, Karen A.; Pitkin, James A. |
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| Citation Year: | 1977 |
| Type: | citation/reference |
| Text: | Calibration constants for the Geodata International, Inc., and Texas Instruments, Inc.: high sensitivity systems used for the ERDA aerial gamma-ray surveys; 1977; OFR; 77-159; Duval, Joseph S.; Schulz, Karen A.; Pitkin, James A. |
| URL (THUMBNAIL): | http://pubs.er.usgs.gov/thumbnails/usgs_thumb.jpg |
| Date Other: | Sat, 1 Jan 1994 00:00 -0600 |
| Publisher: | U.S. Geological Survey, |
