X-ray diffractometer studies of some vanadium silicates

John C. Hathaway

doi:10.3133/tei542

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X-ray diffractometer studies of some vanadium silicates

Trace Elements Investigations 542

By: John C. Hathaway

https://doi.org/10.3133/tei542

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Document: Report (pdf)
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Abstract

Additional publication details
Publication type	Report
Publication Subtype	USGS Numbered Series
Title	X-ray diffractometer studies of some vanadium silicates
Series title	Trace Elements Investigations
Series number	542
DOI	10.3133/tei542
Edition	-
Year Published	1955
Language	ENGLISH
Description	21 p., 7 fig.
Scale	100000
Google Analytic Metrics	Metrics page