Effect of crystal thickness and geometry on the alpha-particle resolution of CsI (Tl)
Review of Scientific Instruments
By: P. Martinez and F. E. Senftle
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Abstract
The resolution of CsI(Tl) for Po210 alpha particles has been measured as a function of crystal thickness. The best resolution of a ½‐in. diam cylindrical crystal was obtained for a thickness of 0.38 mm, and the effect of thickness on the resolution is discussed. Based on the proposed model, a conical crystal was designed, which yielded a line width of 1.8% for Po210 alpha particles with a selected photomultiplier tube.
| Publication type | Article |
|---|---|
| Publication Subtype | Journal Article |
| Title | Effect of crystal thickness and geometry on the alpha-particle resolution of CsI (Tl) |
| Series title | Review of Scientific Instruments |
| DOI | 10.1063/1.1717121 |
| Volume | 31 |
| Issue | 9 |
| Year Published | 1960 |
| Language | English |
| Publisher | AIP Publishing |
| Description | 4 p. |
| First page | 974 |
| Last page | 977 |
| Google Analytic Metrics | Metrics page |