Rapid-scanning microphotometry

A.W. Helz

doi:10.3133/tei579

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Rapid-scanning microphotometry

Trace Elements Investigations 579

By: A.W. Helz

https://doi.org/10.3133/tei579

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Document: Report
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Abstract

A rapid-scanning microphotometer is described with which a 10-inch spectrum may be scanned in two minutes. The resulting chart may be 60, 300, or 1,500 cm long (wavelength scale) and 4 cm high (intensity scale). Commercially available components are used.

Additional publication details
Publication type	Report
Publication Subtype	USGS Numbered Series
Title	Rapid-scanning microphotometry
Series title	Trace Elements Investigations
Series number	579
DOI	10.3133/tei579
Year Published	1956
Language	English
Publisher	U. S. Geological Survey
Description	12 p.
Google Analytic Metrics	Metrics page