Estimating the encounter rate variance in distance sampling
Biometrics
By: R.M. Fewster, S.T. Buckland, K.P. Burnham, D.L. Borchers, P.E. Jupp, J.L. Laake, and L. Thomas
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Abstract
The dominant source of variance in line transect sampling is usually the encounter rate variance. Systematic survey designs are often used to reduce the true variability among different realizations of the design, but estimating the variance is difficult and estimators typically approximate the variance by treating the design as a simple random sample of lines. We explore the properties of different encounter rate variance estimators under random and systematic designs. We show that a design-based variance estimator improves upon the model-based estimator of Buckland et al. (2001, Introduction to Distance Sampling. Oxford: Oxford University Press, p. 79) when transects are positioned at random. However, if populations exhibit strong spatial trends, both estimators can have substantial positive bias under systematic designs. We show that poststratification is effective in reducing this bias. ?? 2008, The International Biometric Society.
| Publication type | Article |
|---|---|
| Publication Subtype | Journal Article |
| Title | Estimating the encounter rate variance in distance sampling |
| Series title | Biometrics |
| DOI | 10.1111/j.1541-0420.2008.01018.x |
| Volume | 65 |
| Issue | 1 |
| Year Published | 2009 |
| Language | English |
| Larger Work Type | Article |
| Larger Work Subtype | Journal Article |
| Larger Work Title | Biometrics |
| First page | 225 |
| Last page | 236 |
| Google Analytic Metrics | Metrics page |